APLMF Mission Statement
The Asia-Pacific Legal Metrology Forum (APLMF) is a grouping of legal metrology authorities, whose objective is the development of legal metrology and the promotion of free and open trade in the region through the harmonisation and removal of technical or administrative barriers to trade in the field of legal metrology. As one of the regional organisations working in close liaison with the OIML, the APLMF promotes communication and interaction among the legal metrology organisations and seeks harmonisation of legal metrology in the Asia Pacific region.
APMP, APLAC and APLMF are recognized by the Asia-Pacific Economic Cooperation (APEC), as Specialist Regional Bodies. Specialist Regional Bodies assist the APEC Sub-committee on Standards and Conformance to meet the objective of eliminating technical barriers to trade within the region.
APLMF Training and Events
Small Training Course for APLMF Working Group on
Quality Measurement of Agricultural Products (QMAP)
Note: More details, dates and brochures will be added as they come to hand.
The 25th APLMF Forum and Working Group Meetings will be held from Wednesday the 7th to Friday the 9th of November 2018 in Christchurch, New Zealand.
During the meetings, a number of topics including the annual reports from the APLMF Working Groups, APLMF President and Secretariat, planning APLMF future activities and the cooperation among APLMF, international and regional metrology organisations will be addressed.
You can find the registration form, the programme and other information about the venue, accommodation and transport on the 25th Forum and Working Group Meetings Homepage.
24th APLMF Forum and Working Group Meetings Highlights
Economy Reports & Poster Session
The Asia-Pacific Legal Metrology Forum APLMF is a grouping of legal metrology authorities, whose objective is the development of legal metrology and the promotion of free and open trade in the region through the harmonisation and removal of technical or administrative barriers to trade in the field of legal metrology.