At its meeting in October 2016, the International Committee of Legal Metrology (CIML) decided that the existing OIML Certification Systems will be replaced by a new single Certification System (OIML-CS) on 1 January 2018. The consequence is that after 1 January 2018 both OIML MAA Certificates and Basic Certificates will no longer be issued – instead, OIML-CS Certificates will be issued.
This change will affect all stakeholders: manufacturers, Issuing Participants under the MAA, Issuing Authorities under the Basic System, Utilizers and users of OIML MAA and Basic Certificates. Therefore a one-day seminar on the new OIML-CS is planned on 15 June 2017.
Information on the seminar, including how to register, can be found here.
The 20th of May will mark this years World Metrology Day. The theme this year is 'Measurements for transport'. This theme was chosen because transport plays such a key role in the modern world. We not only move ourselves, but also the food we eat, the clothes we wear, the goods we use and rely on, not forgetting the raw materials they are made from. Doing so safely, efficiently and with minimal environmental impact requires an astonishing range of measurements.
World Metrology Day is an annual celebration of the signature of the Metre Convention on 20 May 1875 by representatives of seventeen nations. The Convention set the framework for global collaboration in the science of measurement and in its industrial, commercial and societal applications. The original aim of the Metre Convention - the world-wide uniformity of measurement - remains as important today as it was in 1875.
You can learn more about World Metrology Day on the joint BIPM & OIML website.
Following on from the 23rd APLMF and Working Group Meetings held in Tokyo we have produced two short videos on the highlights of the meetings and the economy reports presented. You can view these videos below.
All other presentations and documents discussed at the meeting are available on the annual meeting section of our website.
APLMF Guide 1 - 'National Metrological Infrastructure Joint Guide 1' Second Edition Released
The APLMF is pleased to announce that it has recently released the second edition of APLMF Guide 1 - 'National Metrological Infrastructure Joint Guide 1'.
The updated guide is designed to provide an overview of elements of a national metrological infrastructure, with attention devoted to the situation of member economies in the Asia-Pacific region. Its starting point is a consideration of the international activities that underpin national metrology systems and of the organizations that carry out those activities.
Can you view this and other APLMF guides here.